Title : 
Multilayer parylene-C stencils for dynamically controlling cell interactions
         
        
            Author : 
Chen, C.-L. ; Jinno, S. ; Möller, H. ; Rajalingam, B. ; Chao, S.H. ; Selvarasah, S. ; Khademhosseini, A. ; Dokmeci, M.R.
         
        
            Author_Institution : 
Northeastern Univ., Boston
         
        
        
        
        
        
            Abstract : 
Most cell processes involve dynamic interactions between the cells and their microenvironment and the ability to control the microenvironment is of crucial importance for studying these processes in-vitro. In this study, we describe a technology for creating multilayer and mechanically robust parylene-C stencils and demonstrate the ability to generate a series of at least 5 temporally controlled cell co-culture micropatterns using embryonic stem cells as the primary cell type. Utilizing layer by layer coatings of collagen and fibronectin, both untreated and anti-stiction layer treated parylene-C surfaces are rendered adhesive for cells. Co-culturing using parylene-C stencils may find broad applications in studies investigating cellular interactions and in studies requiring a controlled microenvironment, such as stem cell differentiation.
         
        
            Keywords : 
cellular biophysics; multilayers; antistiction layer; cell co-culture micropatterns; cell interaction dynamic control; cell processes; collagen coating; embryonic stem cells; fibronectin coating; multilayer creation; multilayer parylene-C stencil; Biomedical engineering; Coatings; Etching; Fabrication; In vitro; Nonhomogeneous media; Plasma applications; Plasma temperature; Silicon; Stem cells;
         
        
        
        
            Conference_Titel : 
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
         
        
            Conference_Location : 
Tucson, AZ
         
        
        
            Print_ISBN : 
978-1-4244-1792-6
         
        
            Electronic_ISBN : 
1084-6999
         
        
        
            DOI : 
10.1109/MEMSYS.2008.4443646