• DocumentCode
    2918264
  • Title

    Surface nanostructuring of biocompatible polymer for wettability control in MEMS

  • Author

    Teh, K.S. ; Lu, Y.W.

  • Author_Institution
    San Francisco State Univ., San Francisco
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    363
  • Lastpage
    366
  • Abstract
    We present a low-potential method to control surface roughness of doped polypyrrole through redox-induced transformation in surface morphology. By varying the electric potential of as-deposited doped polypyrrole in aqueous sodium dodecylbenzene sulfonate (0.1M) from -0.6 to +1.5V (vs. Ag/AgCl), doped polypyrrole transforms from being a hydrophilic film (60deg contact angle) to a hydrophobic film (107deg contact angle). Atomic force microscope measurements verify that the surface morphologies of doped polypyrrole, when subject to applied potentials from -0.6V to +1.5V, change from smooth (average roughness of 3.1 nm) to rough (average roughness of 31.1 nm), representing a 10-fold increase in surface roughness. Based on these evidence, we postulate that the degree of oxidation strongly influence surface roughness.
  • Keywords
    atomic force microscopy; bioMEMS; biomedical materials; conducting polymers; contact angle; electric potential; filled polymers; oxidation; reduction (chemical); surface morphology; surface roughness; surface treatment; wetting; MEMS; aqueous sodium dodecylbenzene sulfonate; atomic force microscope measurements; biocompatible polymer; contact angle; degree of oxidation; doped polypyrrole; electric potential; hydrophilic film; hydrophobic film; redox-induced transformation; surface morphology; surface nanostructuring; surface roughness control; voltage -0.6 V to 1.5 V; wettability control; Atomic force microscopy; Atomic measurements; Electric potential; Force measurement; Micromechanical devices; Oxidation; Polymers; Rough surfaces; Surface morphology; Surface roughness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443668
  • Filename
    4443668