DocumentCode :
2918576
Title :
Crystal orientation dependence of fatigue characteristics in single crystal silicon measured using a rotating micro resonator
Author :
Ikehara, T. ; Tsuchiya, T.
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
435
Lastpage :
438
Abstract :
This paper reports the effect of crystal orientation on the fatigue fracture characteristics of single crystal silicon (SCS). Two types of micro resonators that have the same shapes were aligned to different directions: lang110rang and lang100rang. As a result, significant fatigue-life difference was observed. The lang100rang oriented test pieces showed almost 104 times longer fatigue life than the lang110rang oriented test pieces against same bending deflection. The difference is discussed through the fracture surface observation and stress analyses including both anisotropic elastic properties and anisotropic fracture strength.
Keywords :
bending; crystal orientation; fatigue testing; fracture toughness testing; micromechanical resonators; silicon; stress analysis; Si; anisotropic elastic properties; anisotropic fracture strength; bending deflection; crystal orientation dependence; fatigue fracture characteristics; fracture surface observation; rotating micro resonator; single crystal silicon; stress analysis; Anisotropic magnetoresistance; Fatigue; Finite element methods; Life testing; Lithography; Micromechanical devices; Rotation measurement; Scattering; Silicon; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443686
Filename :
4443686
Link To Document :
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