DocumentCode
2918637
Title
Exploiting the capture effect to improve WLAN throughput
Author
Patras, Paul ; Qi, Hanghang ; Malone, David
Author_Institution
Hamilton Inst., Nat. Univ. of Ireland Maynooth, Maynooth, Ireland
fYear
2012
fDate
25-28 June 2012
Firstpage
1
Lastpage
9
Abstract
In practical WLAN deployments, the capture effect has been shown to enhance the performance of stations residing close to the AP, while putting at disadvantage the distant nodes. In this paper, we introduce an analytical model to characterise the performance of 802.11 devices with heterogeneous capture probabilities and different network loads, and explore the interaction between the MAC operation and PHY capture. Unlike previous studies, we reveal that the throughput of stations experiencing low capture probabilities can also benefit from the capture effect when the stations retaining high capture probabilities are not saturated. Following these findings, we design a power-hopping scheme for 802.11 MAC that exploits the benefits of the capture effect to improve performance in dense deployments where nodes experience similar channel conditions. We investigate the potential gains of this mechanism by implementing a practical approximation using commercial off-the-shelf hardware and open-source drivers and, by conducting experiments in a real testbed, we show that our scheme can significantly outperform the standard 802.11 protocol in terms of throughput.
Keywords
access protocols; telecommunication channels; wireless LAN; 802.11 MAC; 802.11 devices performance; MAC operation; PHY capture; WLAN deployments; WLAN throughput; capture effect; channel conditions; heterogeneous capture probabilities; high capture probabilities; nodes experience; off-the-shelf hardware; open-source drivers; power-hopping scheme; standard 802.11 protocol; Analytical models; IEEE 802.11 Standards; Load modeling; Numerical models; Protocols; Throughput; Wireless LAN;
fLanguage
English
Publisher
ieee
Conference_Titel
World of Wireless, Mobile and Multimedia Networks (WoWMoM), 2012 IEEE International Symposium on a
Conference_Location
San Francisco, CA
Print_ISBN
978-1-4673-1238-7
Electronic_ISBN
978-1-4673-1237-0
Type
conf
DOI
10.1109/WoWMoM.2012.6263697
Filename
6263697
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