Title :
SEU measurements and predictions on MPTB for a large energetic solar particle event
Author :
Campbell, Art ; Buchner, Steve ; Petersen, Ed ; Blake, Bernie ; Mazur, Joe ; Dyer, Clive
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
SEU ground testing and rate calculations have been performed for 16 Mbit DRAMs flown on MPTB using measured particle spectra and compared with space data from a period of high solar activity. The results show that with the measured spectra, the measurements agree quite well with the calculations. Using just modeled environments, the results do not agree as well.
Keywords :
DRAM chips; radiation hardening (electronics); solar radiation; 16 Mbit; 16 Mbit DRAMs; MPTB; Microelectronics and Photonics Testbed Experiment; SEU ground testing; high solar activity; large energetic solar particle event; measured particle spectra; rate calculations; space data; Energy measurement; Ion accelerators; Laboratories; Life estimation; Particle measurements; Predictive models; Protons; Random access memory; Single event upset; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159254
