Title :
Compton scattered imaging based on the V-line radon transform and its medical imaging applications
Author :
Nguyen, M.K. ; Régnier, R. ; Truong, T.T. ; Zaidi, H.
Author_Institution :
Equipes Traitement de l´´Inf. et Syst., Univ. de Cergy-Pontoise, Cergy-Pontoise, France
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
The Radon transform (RT) on straight lines deals as mathematical foundation for many tomographic modalities (e.g. Xray scanner, Positron Emission Tomography), using only primary radiation. In this paper, we consider a new RT defined on a pair of half-lines forming a letter V, arising from the modeling a two-dimensional emission imaging process by Compton scattered gamma rays. We establish its analytic inverse, which is shown to support the feasibility of the reconstruction of a two-dimensional image from scattered radiation collected on a one-dimensional collimated camera. Moreover, a filtered back-projection inversion method is also constructed. Its main advantages are algorithmic efficiency and computational rapidity. We present numerical simulations to illustrate the working. To sum up, the V-line RT leads not only to a new imaging principle, but also to a new concept of detector with high energetic resolution capable to collect the scattered radiation.
Keywords :
Compton effect; Radon transforms; cameras; filtering theory; gamma-ray scattering; image reconstruction; medical image processing; Compton scattered gamma rays; Compton scattered imaging; Radon transform; V-line Radon transform; filtered back-projection inversion method; image reconstruction; medical imaging; numerical simulations; one-dimensional collimated Moreover; two-dimensional emission imaging; Cameras; Detectors; Image reconstruction; Numerical simulation; Photonics; Transforms; Radon transforms; image reconstruction; nuclear imaging; tomography; Algorithms; Computer Simulation; Diagnostic Imaging; Feasibility Studies; Radon;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626139