Title :
Noise measurements of a 45-GHz mode-locked laser diode
Author :
Jiang, L.A. ; Grein, Matthew E. ; Ippen, Erich P ; Haus, H.A. ; Shimizu, Tsuyoshi ; Kurita, Hiroshi ; Yokoyama, Haruki
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
Summary form only given.The noise of a mode-locked laser diode (MLLD) can be broken into four orthogonal fluctuations: energy, carrier phase, frequency, and timing. We measure the carrier phase noise as well as the energy fluctuations of a bisection monolithically integrated 45-GHz repetition rate MLLD and compare it to theory. The width of pulses are 1.3 ps, the overall length of the laser diode is 960 /spl mu/m (driven at 38.2 mA), and the length of the saturable absorber section is 60 /spl mu/m (biased at 0.225 V). Implications for short pulse systems are discussed.
Keywords :
intensity modulation; laser mode locking; laser noise; optical pulse generation; phase noise; semiconductor lasers; 1.3 ps; 38.2 mA; bisection monolithically integrated laser; carrier phase noise; energy fluctuations; intensity noise; mode-locked laser diode; orthogonal fluctuations; saturable absorber; short pulse systems; Diode lasers; Energy measurement; Fluctuations; Frequency; Noise measurement; Optical pulses; Phase measurement; Phase noise; Space vector pulse width modulation; Timing;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.906773
