Noise measurements of a 45-GHz mode-locked laser diode

Author

Jiang, L.A. ; Grein, Matthew E. ; Ippen, Erich P ; Haus, H.A. ; Shimizu, Tsuyoshi ; Kurita, Hiroshi ; Yokoyama, Haruki

Author_Institution

Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA

fYear

2000

fDate

7-12 May 2000

Firstpage

98

Lastpage

99

Abstract

Summary form only given.The noise of a mode-locked laser diode (MLLD) can be broken into four orthogonal fluctuations: energy, carrier phase, frequency, and timing. We measure the carrier phase noise as well as the energy fluctuations of a bisection monolithically integrated 45-GHz repetition rate MLLD and compare it to theory. The width of pulses are 1.3 ps, the overall length of the laser diode is 960 /spl mu/m (driven at 38.2 mA), and the length of the saturable absorber section is 60 /spl mu/m (biased at 0.225 V). Implications for short pulse systems are discussed.

Keywords

intensity modulation; laser mode locking; laser noise; optical pulse generation; phase noise; semiconductor lasers; 1.3 ps; 38.2 mA; bisection monolithically integrated laser; carrier phase noise; energy fluctuations; intensity noise; mode-locked laser diode; orthogonal fluctuations; saturable absorber; short pulse systems; Diode lasers; Energy measurement; Fluctuations; Frequency; Noise measurement; Optical pulses; Phase measurement; Phase noise; Space vector pulse width modulation; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on

Conference_Location

San Francisco, CA, USA

Print_ISBN

1-55752-634-6

Type

conf

DOI

10.1109/CLEO.2000.906773

Filename

906773