DocumentCode :
2919394
Title :
Adapting a C-element design flow for low power
Author :
Moreira, Matheus ; Oliveira, Bruno ; Pontes, Julian ; Moraes, Fernando ; Calazans, Ney
Author_Institution :
Fac. de Inf., Pontificia Univ. Catolica do Rio Grande do Sul, Porto Alegre, Brazil
fYear :
2011
fDate :
11-14 Dec. 2011
Firstpage :
45
Lastpage :
48
Abstract :
The interest in non-synchronous design of digital circuits is growing due to technology scaling into deep submicron transistor geometries and to the problems this scaling causes to keep synchronous design advantageous. To enable most non-synchronous styles, the C-element is a fundamental device that has to be available as logic primitive. A recently proposed design flow improved a standard cell library, adding to it a set of typical asynchronous cells. However, the original flow did not address low power cells explicitly, which is a requirement in many modern applications. This paper proposes the extension of the flow so that it can expand the cell set with low power components. To achieve this, the paper adds a new degree of freedom to cell design. The new standard cell set encompasses over 500 different C-element implementations. The cell set employs a 65nm commercial CMOS process and is fully compliant with the foundry standard cell library. A fully asynchronous RSA crypto core was designed with the new cells, producing savings of more than 35% in total power and more than 69% in leakage power.
Keywords :
CMOS logic circuits; logic design; C-element design flow; CMOS process; asynchronous RSA crypto core; asynchronous cells; deep submicron transistor geometries; digital circuit nonsynchronous design; foundry standard cell library; logic primitive; low power cells; low power components; size 65 nm; standard cell library; Delay; Integrated circuit modeling; Logic gates; Power demand; Synchronization; Transistors; Wires; C-element; asynchronous design; low power;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4577-1845-8
Electronic_ISBN :
978-1-4577-1844-1
Type :
conf
DOI :
10.1109/ICECS.2011.6122210
Filename :
6122210
Link To Document :
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