Title :
Single event burnout in DC-DC converters for the LHC experiments
Author :
Rivetta, C. ; Allongue, B. ; Berger, G. ; Faccio, F. ; Hajdas, W.
Author_Institution :
Fermi Nat. Accel. Lab., USA
Abstract :
High voltage transistors in DC-DC converters are prone to catastrophic single event burnout in the LHC radiation environment. This paper presents a systematic methodology to analyze single event effects sensitivity in converters and proposes solutions based on de-rating input voltage and output current or voltage.
Keywords :
DC-DC power convertors; integrated circuit reliability; neutron effects; power integrated circuits; DC-DC converters; LHC radiation environment; de-rating; high voltage transistors; single event burnout; DC-DC power converters; Detectors; Large Hadron Collider; Linear particle accelerator; Low voltage; Neutrons; Particle beams; Power supplies; Power system reliability; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159300
