DocumentCode
2919729
Title
Single event burnout in DC-DC converters for the LHC experiments
Author
Rivetta, C. ; Allongue, B. ; Berger, G. ; Faccio, F. ; Hajdas, W.
Author_Institution
Fermi Nat. Accel. Lab., USA
fYear
2001
fDate
10-14 Sept. 2001
Firstpage
315
Lastpage
322
Abstract
High voltage transistors in DC-DC converters are prone to catastrophic single event burnout in the LHC radiation environment. This paper presents a systematic methodology to analyze single event effects sensitivity in converters and proposes solutions based on de-rating input voltage and output current or voltage.
Keywords
DC-DC power convertors; integrated circuit reliability; neutron effects; power integrated circuits; DC-DC converters; LHC radiation environment; de-rating; high voltage transistors; single event burnout; DC-DC power converters; Detectors; Large Hadron Collider; Linear particle accelerator; Low voltage; Neutrons; Particle beams; Power supplies; Power system reliability; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN
0-7803-7313-8
Type
conf
DOI
10.1109/RADECS.2001.1159300
Filename
1159300
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