Towards a single event transient hardness assurance methodology

An hardness assurance methodology for evaluating the radiation single event transient susceptibility of analog devices is proposed. Experimental results are first used to demonstrate that specific design criteria are necessary to quantify the sensitivity of the application considered. The duration and maximum amplitude criteria and the cross section curve are these criteria. Therefore, these data are used to deduce a cost effective and appropriate methodology to take into account the single event transient effects on linear integrated circuits in a space program.