• DocumentCode
    2919966
  • Title

    DYNAMO: Dynamic multi-model source localization method for EEG and/or MEG

  • Author

    Antelis, Javier M. ; Minguez, Javier

  • Author_Institution
    Dept. of Inf. & Syst. Eng., Univ. of Zaragoza, Zaragoza, Spain
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    5141
  • Lastpage
    5144
  • Abstract
    This paper proposes a multiple model method that addresses the estimation of the EEG/MEG neural sources as a multihypothesis, multidimensional and dynamic estimation problem. The key aspect is the probabilistic integration of several neural models to simultaneously estimate and integrate the brain activity of different dynamic neural processes that are characterized by the number of sources, the dynamic of those sources and the initial conditions. The method was validated with EEG data gathered in a protocol to elicit error-related potentials, since there is evidence of the brain region that generate those signals. The results reveal that the proposed multiple model method is able to identify the brain structure associated with error processing, which is a preliminary indicator of the validity of the proposed method.
  • Keywords
    bioelectric potentials; biomedical measurement; electroencephalography; magnetoencephalography; medical signal processing; probability; DYNAMO; EEG neural source estimation; MEG neural source estimation; brain activity; dynamic estimation problem; dynamic multimodel source localization method; error processing associated brain structure; error related potentials; multidimensional estimation problem; multihypothesis estimation problem; multiple model method; probabilistic integration; Brain modeling; Electroencephalography; Estimation; Protocols; Scalp; Visualization; Algorithms; Brain Waves; Electroencephalography; Humans; Magnetoencephalography; Male; Models, Neurological;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5626181
  • Filename
    5626181