Title :
Coping with SEUs/SETs in microprocessors by means of low-cost solutions: a comparison study
Author :
Rebaudengo, M. ; Reorda, M. Sonza ; Violante, M. ; Nicolescu, B. ; Velano, R.
Author_Institution :
Dipt. di Automatica e Informatica, Politecnico di Torino, Italy
Abstract :
In this paper two low-cost solutions devoted to provide processor-based systems with error detection capabilities are compared. The effects of SEUs and SETs are studied through simulation-based fault injection. The error detection capabilities of a hardware-implemented solution, based on parity code, are compared with those of a software-implemented solution based on source-level code modification. Radiation testing experiments confirmed results obtained by simulation.
Keywords :
integrated circuit testing; radiation hardening (electronics); SEUs/SETs; error detection capabilities; hardware-implemented solution; low-cost solutions; microprocessors; parity code; simulation-based fault injection; software-implemented solution; source-level code modification; Application software; Circuit faults; Computational modeling; Computer errors; Error correction; Fault detection; Hardware; Microprocessors; Single event transient; Telephony;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159312
