• DocumentCode
    2919985
  • Title

    Temperature-dependent properties of an individual memsintegrated single-walled carbon nanotube

  • Author

    Jungen, A. ; Gauckler, J. ; Stampfer, C. ; Durrer, L. ; Helbling, T. ; Hierold, C.

  • Author_Institution
    ETH Zurich, Zurich
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    733
  • Lastpage
    736
  • Abstract
    We present spatially resolved Raman studies on individual single-walled carbon nanotubes (SWNTs). Samples were comprised of microheaters with integrated and suspended SWNTs. We found the phonon frequency to depend on temperature by domega/dT = -0.0305 cm-1/K. The highest measured local temperature in a SWNT was about 1000 K. Further studies emphasize the effect of temperature on the energy shift of the optical transition energies. By performing spatially resolved line cuts across the tubes, we found a strong off-resonance effect resulting in reduced Raman intensity due to transition energy shifts. Based on a thermally activated transport model, the behavior of a heated SWNT in terms of its electrical resistance can be predicted.
  • Keywords
    Raman spectroscopy; carbon nanotubes; electric heating; electric resistance; measurement by laser beam; micromechanical devices; C; MEMS-integrated single-walled carbon nanotube; electrical resistance; microheaters; optical transition energy; phonon frequency; spatially resolved Raman study; temperature 1000 K; temperature-dependent properties; thermally activated transport model; Carbon nanotubes; Energy measurement; Energy resolution; Frequency measurement; Phonons; Predictive models; Spatial resolution; Temperature dependence; Temperature measurement; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443761
  • Filename
    4443761