• DocumentCode
    2920032
  • Title

    Boolean functions over nano-fabrics: Improving resilience through coding

  • Author

    Lee, Sang Hyun ; Vishwanath, Sriram

  • Author_Institution
    Univ. of Texas at Austin, Austin, TX, USA
  • fYear
    2010
  • fDate
    6-8 Jan. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper determines mechanisms to tackle errors when implementing Boolean functions in nano-circuits. Nano-fabrics are expected to have very high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap but unreliable nano-device as the main function and reliable but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don´t-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm.
  • Keywords
    Boolean functions; CMOS integrated circuits; dynamic programming; encoding; logic circuits; nanoelectronics; trees (mathematics); Boolean function; CMOS device; atomic variation; coding mechanism; constraint satisfaction problem; nano-circuits; nano-fabrics; tree-based dynamic programming; Boolean functions; Circuit noise; Decoding; Error correction; Fabrics; Logic circuits; Read only memory; Redundancy; Resilience; Table lookup;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Theory (ITW 2010, Cairo), 2010 IEEE Information Theory Workshop on
  • Conference_Location
    Cairo
  • Print_ISBN
    978-1-4244-6372-5
  • Type

    conf

  • DOI
    10.1109/ITWKSPS.2010.5503134
  • Filename
    5503134