Title : 
Boolean functions over nano-fabrics: Improving resilience through coding
         
        
            Author : 
Lee, Sang Hyun ; Vishwanath, Sriram
         
        
            Author_Institution : 
Univ. of Texas at Austin, Austin, TX, USA
         
        
        
        
        
        
            Abstract : 
This paper determines mechanisms to tackle errors when implementing Boolean functions in nano-circuits. Nano-fabrics are expected to have very high defect rates as atomic variations directly impact such materials. This paper develops a coding mechanism that uses a combination of cheap but unreliable nano-device as the main function and reliable but expensive CMOS devices to implement the coding mechanism. The unique feature of this paper is that it exploits the don´t-cares that naturally occur in Boolean functions to construct better codes. The reliable Boolean function problem is cast as a constraint satisfaction problem and then solved using a tree-based dynamic programming algorithm.
         
        
            Keywords : 
Boolean functions; CMOS integrated circuits; dynamic programming; encoding; logic circuits; nanoelectronics; trees (mathematics); Boolean function; CMOS device; atomic variation; coding mechanism; constraint satisfaction problem; nano-circuits; nano-fabrics; tree-based dynamic programming; Boolean functions; Circuit noise; Decoding; Error correction; Fabrics; Logic circuits; Read only memory; Redundancy; Resilience; Table lookup;
         
        
        
        
            Conference_Titel : 
Information Theory (ITW 2010, Cairo), 2010 IEEE Information Theory Workshop on
         
        
            Conference_Location : 
Cairo
         
        
            Print_ISBN : 
978-1-4244-6372-5
         
        
        
            DOI : 
10.1109/ITWKSPS.2010.5503134