Title :
Estimation of ion- and proton-induced SEU rate by two values of saturation cross sections
Author :
Chumakov, Alexander I. ; Tverskoy, M.G.
Author_Institution :
Specialized Electron. Syst., Moscow, Russia
Abstract :
Correlation between parameters of ion- and proton-induced Single Event Upsets is analyzed. We propose to use two values of saturation cross sections for estimation of cross section dependencies on ion LET and on proton energy.
Keywords :
ion beam effects; proton effects; radiation hardening (electronics); Single Event Upsets; cross section dependencies; ion-induced SEU rate; proton-induced SEU rate; saturation cross sections; Energy exchange; Energy measurement; Information analysis; Ion accelerators; Ion beams; Life estimation; Nuclear power generation; Proton accelerators; Single event upset; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
DOI :
10.1109/RADECS.2001.1159314
