Title :
Silica film preparation by chemical vapor deposition using vacuum ultraviolet excimer lamps
Author :
Kurosawa, K. ; Yanagida, H. ; Takezoe, N. ; Takezoe ; Kawasaki, Yoji ; Fujita, Goro ; Miyano, J. ; Yokotani, A.
Author_Institution :
Dept. of Vacuum UV Photosci., Inst. for Molecular Sci., Okazaki, Japan
Abstract :
Summary form only given. We have developed a new scheme to fabricate silica film coatings on the basis of a photochemical vapor deposition method with five different excimer lamps which emit incoherent light from 126 nm to 308 nm in VUV to UV spectral region. The VUV photons have the ability to dissociate tetraethoxyorthosilicate molecules to generate Si-O fragments and have resulted in SiO/sub 2/ film deposition on such substrates as sapphire, crystal quartz and silicon wafers at room temperature. FTIR spectra taken from SiO/sub 2/ films prepared with five different excimer lamps indicate that the photons from Xe/sub 2/ (172 nm=7.9 eV), Kr/sub 2/ (146 nm=8.5 eV) and Ar/sub 2/ (126 nm=9.8 eV) excimers induce SiO/sub 2/ film preparation, but the photons from KrCl (222 nm=5.5 eV) and XeCl (308 nm=4.0 eV) excimers do not.
Keywords :
argon; chemical vapour deposition; discharge lamps; excimers; krypton; krypton compounds; light sources; photodissociation; silicon compounds; xenon; xenon compounds; 126 to 308 nm; Ar/sub 2/; FTIR spectra; Kr/sub 2/; KrCl; Si-O fragments; SiO/sub 2/; TEOS dissociation; VUV excimer lamps; Xe/sub 2/; XeCl; photochemical vapor deposition; silica film preparation; Argon; Chemical vapor deposition; Coatings; Lamps; Photochemistry; Photonic crystals; Semiconductor films; Silicon compounds; Substrates; Temperature;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.906816