Title :
A reliable full-swing low-distortion CMOS bootstrapped sampling switch
Author :
Asgari, Mohammad Reza ; Pishgar, Seyyed Hossein ; Hashemipour, Omid
Author_Institution :
Microelectron. Lab., Shahid Beheshti Univ., Tehran, Iran
Abstract :
A reliable low-distortion CMOS bootstrapped sampling switch is presented. Compared to conventional bootstrapped switch, this scheme achieves more reliability because the limits of proposed circuit are VDD+VTHn and -|VTHp|. The variation of equivalent conductance of this CMOS sampling switch through input signal is alleviated by a specific switch´s voltage control. The proposed switch is realized with the half number of transistors compared to previously reported scheme which results more simplicity and less area. Simulations using a standard 0.18μm CMOS technology model show about 10dB improvements in both THD and SFDR while using it in a conventional fully-differential sample-and-hold circuit.
Keywords :
CMOS integrated circuits; bootstrap circuits; harmonic distortion; integrated circuit reliability; sample and hold circuits; semiconductor switches; voltage control; CMOS sampling switch; CMOS technology model; SFDR; THD; fully-differential sample-and-hold circuit; reliability; reliable full-swing low-distortion CMOS bootstrapped sampling switch; size 0.18 mum; switch voltage control; transistors; Boosting; CMOS integrated circuits; Clocks; Logic gates; Reliability; Switches; Switching circuits;
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4577-1845-8
Electronic_ISBN :
978-1-4577-1844-1
DOI :
10.1109/ICECS.2011.6122248