DocumentCode :
2920302
Title :
Radiation effects on commercial CCDs
Author :
Nuns, T. ; David, J.-P. ; Loquet, J.-G. ; Gardillou, F. ; Lescure, M. ; Barde, S.
Author_Institution :
Departement Environnement Spatial, ONERA, Toulouse, France
fYear :
2001
fDate :
10-14 Sept. 2001
Firstpage :
481
Lastpage :
487
Abstract :
Many studies were performed to evaluate charge coupled devices (CCD) under high-energy radiation. As total dose effects concern mainly the oxide charge generation and interface traps at oxide/semiconductor interface, proton and neutron irradiation increase the bulk damage concentration. Different works proposed modeling of dark current increase induced by protons and/or experimental results on total dose effects. Many works concerns rad-tolerant devices. In order to understand degradation processes in commercial CCDs, where total dose induced dark current increase may be more critical for the global device behavior, we have irradiated a component type with a 60Co source and characterized effects on dark current, conversion factor, CTI (charge transfer inefficiency) and supply current. The second part of the paper presents results from a more complete proton, neutron and 60Co experiment (on a Sony CCD).
Keywords :
charge-coupled devices; dark conductivity; gamma-ray effects; neutron effects; proton effects; bulk damage concentration; charge coupled devices; charge transfer inefficiency; commercial CCDs; conversion factor; gamma irradiation; high-energy radiation effects; interface traps; neutron irradiation; oxide charge generation; proton irradiation; total dose effects; total dose induced dark current; Charge coupled devices; Charge transfer; Charge-coupled image sensors; Current supplies; Dark current; Degradation; Neutrons; Performance evaluation; Protons; Radiation effects;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2001. 6th European Conference on
Print_ISBN :
0-7803-7313-8
Type :
conf
DOI :
10.1109/RADECS.2001.1159327
Filename :
1159327
Link To Document :
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