DocumentCode :
2920386
Title :
Wafer-level sandwiched packaging for high-yield fabrication of high-performance mems inertial sensors
Author :
Zhang, Kun ; Jiang, Wei ; Li, Xinxin
Author_Institution :
Chinese Acad. of Sci., Shanghai
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
814
Lastpage :
817
Abstract :
A wafer-level sandwiched packaging technology is developed for micromechanical sensors such as inertial sensors, which comprise movable parts, e.g. spring-mass structures. Via a thin polymer intermediate layer of benzocyclobuene (BCB), a pre-micromachined silicon cap wafer is aligned bonded with the sensor-chip wafer. Prior to the BCB bonding, the sensor-chip wafer was formed by anodic bonding a Pyrex-7740 glass wafer to the silicon wafer with the sensing elements formed. This sandwich wafer level packaging can protect the formed micromechanical structures from damage or dirty during the saw dicing, and facilitates plastic molding device package. With the technique, various kinds of accelerometers have been high-yield and low-cost packaged.
Keywords :
inertial systems; micromachining; microsensors; polymer films; wafer bonding; wafer level packaging; Pyrex-7740 glass wafer; accelerometers; anodic bonding; benzocyclobuene bonding; high-performance MEMS inertial sensors; high-yield fabrication; micromechanical structures prevention; pre-micromachined silicon cap wafer; sensor-chip wafer; silicon wafer; spring-mass structures; wafer-level sandwiched packaging technology; Fabrication; Glass; Micromechanical devices; Packaging; Plastics; Polymers; Protection; Silicon; Wafer bonding; Wafer scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443781
Filename :
4443781
Link To Document :
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