• DocumentCode
    2920429
  • Title

    Learning object color models from multi-view constraints

  • Author

    Owens, Trevor ; Saenko, Kate ; Chakrabarti, Ayan ; Xiong, Ying ; Zickler, Todd ; Darrell, Trevor

  • Author_Institution
    UC Berkeley, Berkeley, CA, USA
  • fYear
    2011
  • fDate
    20-25 June 2011
  • Firstpage
    169
  • Lastpage
    176
  • Abstract
    Color is known to be highly discriminative for many object recognition tasks, but is difficult to infer from uncontrolled images in which the illuminant is not known. Traditional methods for color constancy can improve surface reflectance estimates from such uncalibrated images, but their output depends significantly on the background scene. In many recognition and retrieval applications, we have access to image sets that contain multiple views of the same object in different environments; we show in this paper that correspondences between these images provide important constraints that can improve color constancy. We introduce the multi-view color constancy problem, and present a method to recover estimates of underlying surface reflectance based on joint estimation of these surface properties and the illuminants present in multiple images. The method can exploit image correspondences obtained by various alignment techniques, and we show examples based on matching local region features. Our results show that multi-view constraints can significantly improve estimates of both scene illuminants and object color (surface reflectance) when compared to a baseline single-view method.
  • Keywords
    image colour analysis; image matching; object recognition; baseline single-view method; image sets; local region feature matching; multiview color constancy problem; object color models; object recognition tasks; scene illuminants; surface reflectance estimation; Computational modeling; Databases; Estimation; Image color analysis; Joints; Lighting; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition (CVPR), 2011 IEEE Conference on
  • Conference_Location
    Providence, RI
  • ISSN
    1063-6919
  • Print_ISBN
    978-1-4577-0394-2
  • Type

    conf

  • DOI
    10.1109/CVPR.2011.5995705
  • Filename
    5995705