• DocumentCode
    2920513
  • Title

    Reducing performance impact of process variation for data caches

  • Author

    Kadayif, Ismail ; Tuncer, Kadir

  • Author_Institution
    Dept. of Comput. Eng., Canakkale Onsekiz Mart Univ., Canakkale, Turkey
  • fYear
    2013
  • fDate
    28-30 Nov. 2013
  • Firstpage
    380
  • Lastpage
    384
  • Abstract
    In concurrent with finer-granular process technologies, it is becoming extremely difficult to keep critical physical device parameters within desired bounds, including channel length, gate oxide thickness, and dopant ion concentration. Variations in these parameters can lead to dramatic variations in access latencies in Static Random Access Memory (SRAM) devices: Different lines of the same cache may have different access latencies. A simple solution to this problem is to adopt the worst-case latency paradigm. While this egalitarian cache management is simple, it may introduce significant performance overhead for data cache accesses. To overcome varying access latencies across different data cache lines, we employ a small table storing the access latencies of cache lines. This table is accessed during data cache access to give a hint to the hardware about how long to wait for data to become available.
  • Keywords
    SRAM chips; cache storage; doping profiles; SRAM devices; channel length; data cache accesses; dopant ion concentration; gate oxide thickness; process variation; static random access memory; worst-case latency paradigm; Benchmark testing; Design automation; Hardware; Performance evaluation; Random access memory; Threshold voltage; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineering (ELECO), 2013 8th International Conference on
  • Conference_Location
    Bursa
  • Print_ISBN
    978-605-01-0504-9
  • Type

    conf

  • DOI
    10.1109/ELECO.2013.6713866
  • Filename
    6713866