Title :
Single image super-resolution using Gaussian process regression
Author :
He, He ; Siu, Wan-chi
Author_Institution :
Dept. of Electron. & Inf. Eng., Hong Kong Polytech. Univ., Hong Kong, China
Abstract :
In this paper we address the problem of producing a high-resolution image from a single low-resolution image without any external training set. We propose a framework for both magnification and deblurring using only the original low-resolution image and its blurred version. In our method, each pixel is predicted by its neighbors through the Gaussian process regression. We show that when using a proper covariance function, the Gaussian process regression can perform soft clustering of pixels based on their local structures. We further demonstrate that our algorithm can extract adequate information contained in a single low-resolution image to generate a high-resolution image with sharp edges, which is comparable to or even superior in quality to the performance of other edge-directed and example-based super-resolution algorithms. Experimental results also show that our approach maintains high-quality performance at large magnifications.
Keywords :
Gaussian processes; image resolution; image restoration; pattern clustering; regression analysis; Gaussian process regression; covariance function; edge-directed super-resolution algorithms; example-based super-resolution algorithms; image deblurring; original low-resolution image; single image super resolution; soft clustering; Equations; Ground penetrating radar; Image edge detection; Image resolution; Mathematical model; Strontium; Training;
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2011 IEEE Conference on
Conference_Location :
Providence, RI
Print_ISBN :
978-1-4577-0394-2
DOI :
10.1109/CVPR.2011.5995713