Title :
Read range limitation in IF-based far-field RFID using ASK backscatter modulation
Author :
Pillin, Nicolas ; Dehollain, Catherine ; Declercq, Michel J.
Author_Institution :
Electron. Lab., Swiss Fed. Inst. of Technol. (EPFL), Lausanne, Switzerland
Abstract :
A model is proposed to describe the fundamental read range limitation due to the local oscillator phase noise in the reader, in IF-based, far-field RFID systems using amplitude-shift keying backscatter modulation. The relation between the system parameters (such as the data transfer rate) and the read range is discussed. The model is validated by measurements done on two different laboratory tag-reader systems.
Keywords :
amplitude shift keying; backscatter; radiofrequency identification; ASK backscatter modulation; IF-based far-field RFID; amplitude-shift keying backscatter modulation; read range limitation; Amplitude shift keying; Backscatter; Baseband; Frequency; Laboratories; Noise level; Phase noise; Power system modeling; Radiofrequency identification; Switches;
Conference_Titel :
Research in Microelectronics and Electronics, 2009. PRIME 2009. Ph.D.
Conference_Location :
Cork
Print_ISBN :
978-1-4244-3733-7
Electronic_ISBN :
978-1-4244-3734-4
DOI :
10.1109/RME.2009.5201297
