DocumentCode :
2920667
Title :
Test Driven Design Challenges for Faster Product Development
Author :
Fraser, Jason ; Mattu, Baldev S.
Author_Institution :
Florida Atlantic Univ., Boca Raton
fYear :
2007
fDate :
9-13 April 2007
Firstpage :
1
Lastpage :
5
Abstract :
Test driven design is a programming methodology that provides an iterative design cycle with integrated testing at each step, leading to reduced time and cost associated with end of cycle testing in the traditional waterfall method of development. In this paper we implemented a small portion of a PBX system to expose common problems in the implementation of Test Driven Design, and propose solutions to the same.
Keywords :
cost reduction; private telephone exchanges; product development; program testing; telecommunication computing; PBX system; Test Driven Design; cost reduction; iterative design cycle; product development; Concurrent computing; Costs; Iterative methods; Lead time reduction; Logic testing; Performance evaluation; Product development; Software testing; System testing; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems Conference, 2007 1st Annual IEEE
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-1041-X
Electronic_ISBN :
1-4244-1041-X
Type :
conf
DOI :
10.1109/SYSTEMS.2007.374647
Filename :
4258852
Link To Document :
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