• DocumentCode
    2920667
  • Title

    Test Driven Design Challenges for Faster Product Development

  • Author

    Fraser, Jason ; Mattu, Baldev S.

  • Author_Institution
    Florida Atlantic Univ., Boca Raton
  • fYear
    2007
  • fDate
    9-13 April 2007
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Test driven design is a programming methodology that provides an iterative design cycle with integrated testing at each step, leading to reduced time and cost associated with end of cycle testing in the traditional waterfall method of development. In this paper we implemented a small portion of a PBX system to expose common problems in the implementation of Test Driven Design, and propose solutions to the same.
  • Keywords
    cost reduction; private telephone exchanges; product development; program testing; telecommunication computing; PBX system; Test Driven Design; cost reduction; iterative design cycle; product development; Concurrent computing; Costs; Iterative methods; Lead time reduction; Logic testing; Performance evaluation; Product development; Software testing; System testing; USA Councils;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Systems Conference, 2007 1st Annual IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-1041-X
  • Electronic_ISBN
    1-4244-1041-X
  • Type

    conf

  • DOI
    10.1109/SYSTEMS.2007.374647
  • Filename
    4258852