Title :
Towards the next generation user interface: the VIU model using a universe paradigm and the globe metaphor for enterprise information visualization
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Abstract :
The next generation user interface for information systems, and indeed for all significant computer environments, will feature model-assisted visualization as its definitive element. This visualization goes beyond the straightforward drawing and rendering of imagery for physically visual objects or phenomena and extends to creating visual interpretation of logical subjects, such as enterprise information, using information and decision models and other profound contextual knowledge of the application. Dynamic animation in continual and interactive environments based on application models is the hallmark of this visualization. A universe paradigm is conceptualized for visualizing the enterprise information and is referred to as the visual information universe (VIU) model. The globe model is developed as the universe paradigm´s basic metaphor, which features both the interior and the surface in an integrated cognitive design. The metadatabase model for enterprise information integration is exploited to afford an experimental environment
Keywords :
computer animation; data visualisation; graphical user interfaces; information systems; technological forecasting; contextual knowledge; dynamic animation; enterprise information visualization; globe metaphor; information systems; interactive environments; metadatabase model; model-assisted visualization; next generation user interface; universe paradigm; visual information universe model; Animation; Computer displays; Computer graphics; Computer interfaces; Context modeling; Data visualization; Embedded computing; Graphical user interfaces; Humans; Information systems; Rendering (computer graphics); Systems engineering and theory; User interfaces; Visualization;
Conference_Titel :
Systems, Man, and Cybernetics, 1994. Humans, Information and Technology., 1994 IEEE International Conference on
Conference_Location :
San Antonio, TX
Print_ISBN :
0-7803-2129-4
DOI :
10.1109/ICSMC.1994.400118