DocumentCode :
2920893
Title :
A micromechanical electrometer approaching single-electron charge resolution at room temperature
Author :
Lee, J.E.-Y. ; Zhu, Y. ; Seshia, A.A.
Author_Institution :
Univ. of Cambridge, Cambridge
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
948
Lastpage :
951
Abstract :
We report a MEMS electrometer with a measured charge noise floor approaching the single-electron threshold (4 e/radicHz) in air at room temperature. The electrometer is based on a modulated capacitor constructed from a micromechanical resonator, which converts DC charge at the input to an output AC voltage with primary frequency components at twice the modulation frequency. The result presented herein confirms earlier results obtained through analytical modeling and provides a path towards achieving sub-electron charge resolution at room temperature.
Keywords :
electrometers; micromechanical resonators; micromechanical electrometer; micromechanical resonator; single-electron charge resolution; Analytical models; Capacitors; Charge measurement; Current measurement; Frequency conversion; Frequency modulation; Micromechanical devices; Noise measurement; Temperature; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443814
Filename :
4443814
Link To Document :
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