• DocumentCode
    2920893
  • Title

    A micromechanical electrometer approaching single-electron charge resolution at room temperature

  • Author

    Lee, J.E.-Y. ; Zhu, Y. ; Seshia, A.A.

  • Author_Institution
    Univ. of Cambridge, Cambridge
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    948
  • Lastpage
    951
  • Abstract
    We report a MEMS electrometer with a measured charge noise floor approaching the single-electron threshold (4 e/radicHz) in air at room temperature. The electrometer is based on a modulated capacitor constructed from a micromechanical resonator, which converts DC charge at the input to an output AC voltage with primary frequency components at twice the modulation frequency. The result presented herein confirms earlier results obtained through analytical modeling and provides a path towards achieving sub-electron charge resolution at room temperature.
  • Keywords
    electrometers; micromechanical resonators; micromechanical electrometer; micromechanical resonator; single-electron charge resolution; Analytical models; Capacitors; Charge measurement; Current measurement; Frequency conversion; Frequency modulation; Micromechanical devices; Noise measurement; Temperature; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443814
  • Filename
    4443814