Title :
A micromechanical electrometer approaching single-electron charge resolution at room temperature
Author :
Lee, J.E.-Y. ; Zhu, Y. ; Seshia, A.A.
Author_Institution :
Univ. of Cambridge, Cambridge
Abstract :
We report a MEMS electrometer with a measured charge noise floor approaching the single-electron threshold (4 e/radicHz) in air at room temperature. The electrometer is based on a modulated capacitor constructed from a micromechanical resonator, which converts DC charge at the input to an output AC voltage with primary frequency components at twice the modulation frequency. The result presented herein confirms earlier results obtained through analytical modeling and provides a path towards achieving sub-electron charge resolution at room temperature.
Keywords :
electrometers; micromechanical resonators; micromechanical electrometer; micromechanical resonator; single-electron charge resolution; Analytical models; Capacitors; Charge measurement; Current measurement; Frequency conversion; Frequency modulation; Micromechanical devices; Noise measurement; Temperature; Voltage;
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
DOI :
10.1109/MEMSYS.2008.4443814