Title :
Classifier-assisted metric for chromosome pairing
Author :
Ventura, Rodrigo ; Khmelinskii, Artem ; Sanches, J. Miguel
Author_Institution :
Inst. for Syst. & Robot., Inst. Super. Tecnico, Lisbon, Portugal
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
Cytogenetics plays a central role in the detection of chromosomal abnormalities and in the diagnosis of genetic diseases. A karyogram is an image representation of human chromosomes arranged in order of decreasing size and paired in 23 classes. In this paper we propose an approach to automatically pair the chromosomes into a karyogram, using the information obtained in a rough SVM-based classification step, to help the pairing process mainly based on similarity metrics between the chromosomes. Using a set of geometric and band pattern features extracted from the chromosome images, the algorithm is formulated on a Bayesian framework, combining the similarity metric with the results from the classifier. The solution is obtained solving a mixed integer program. Two datasets with contrasting quality levels and 836 chromosomes each were used to test and validate the algorithm. Relevant improvements with respect to the algorithm described by the authors were obtained with average paring rates above 92%, close to the rates obtained by human operators.
Keywords :
belief networks; diseases; genetics; image representation; medical image processing; molecular biophysics; patient diagnosis; support vector machines; Bayesian framework; band pattern features; chromosome images; chromosome pairing; classifier-assisted metric; cytogenetics; genetic diseases; human operators; image representation; karyogram; rough SVM-based classification step; Artificial neural networks; Biological cells; Conferences; Feature extraction; Humans; Measurement; Support vector machines; Chromosome; Classification; Image processing; Mixed Integer Programming; Optical Microscopy; Pairing; Support Vector Machines; Algorithms; Chromosome Pairing; Chromosomes, Human; Humans; Karyotyping;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626237