Title :
Directional laser emission from chaotic modes in quadrupole-deformed GaN microdisks
Author :
Rex, N.B. ; Chang, R.K. ; Guido, Louis J. ; Bour, D. ; Kneissl, M.
Author_Institution :
Dept. of Appl. Phys., Yale Univ., New Haven, CT, USA
Abstract :
Summary form only given. Material properties as well as materials processing of GaN results in high laser thresholds. Circular microdisk GaAs and GaN lasers have lower thresholds and non-directional emission, because of the feedback from whispering-gallery modes (WGMs). Stadium-shaped microdisk quantum cascade lasers have greatly increased emission and directionality, because feedback is provided by the regular-orbit "bow tie" modes. We report the achievement of directional laser emission from quadrupolar-deformed-cavity GaN microdisks which have the same threshold as circular microdisks but with feedback provided by chaotic-orbit modes which eventually incident the disk-air interface at angles below the critical angle for total internal reflection.
Keywords :
III-V semiconductors; MOCVD; gallium compounds; ion beam applications; laser beams; laser cavity resonators; laser feedback; laser modes; microdisc lasers; optical chaos; optical fabrication; semiconductor lasers; sputter etching; GaN; GaN microdisks; chaotic modes; chaotic-orbit modes; circular microdisk lasers; circular microdisks; critical angle; directional laser emission; directionality; disk-air interface; emission; feedback; laser thresholds; material properties; materials processing; nondirectional emission; quadrupolar-deformed-cavity GaN microdisks; quadrupole-deformed microdisks; regular-orbit bow tie modes; stadium-shaped microdisk quantum cascade lasers; thresholds; total internal reflection; whispering-gallery modes; Chaos; Gallium arsenide; Gallium nitride; Laser feedback; Laser modes; Material properties; Materials processing; Quantum cascade lasers; Quantum well lasers; Whispering gallery modes;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.906881