A Low Cost circuit level fault detection technique to Full Adder design

This paper proposes a Low Cost circuit level Fault Detection technique called LCFD for a one-bit Full Adder (FA) as the basic element of adder circuits. To measure the fault detection coverage of the proposed technique, we conduct an exhaustive circuit level fault injection experiment on all susceptible nodes of a FA. Experimental results show that the LCDF technique can detect about 83% of injected faults while having only about 40% area and 22% power consumption overheads. In the LCDF technique, the fault detection latency does not affect the latency of the FA, since the error detection is done in parallel with the addition.