DocumentCode :
2921445
Title :
Part tilting in capillary-based self-assembly: Modeling and correction methods
Author :
Abbasi, Shaghayegh ; Zhou, Andrew X. ; Baskaran, Rajashree ; Böhringer, Karl F.
Author_Institution :
Univ. of Washington, Seattle
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
1060
Lastpage :
1063
Abstract :
We present a model and experimental results on tilt angle of microparts in capillary-driven self-assembly. The assembly is carried out in an aqueous environment, using a heat curable adhesive for part-substrate lubrication and mechanical bonding. Silicon parts and substrate have matching hydrophobic binding sites, which drive the assembly by surface energy minimization. Force balance analysis of an assembled part leads to a model describing the dependence of tilt angle on assembly parameters such as adhesive volume and water-adhesive interfacial tension. The effect of adhesive volume on tilt angle is investigated experimentally. Tilt correction of the assembled parts is achieved by providing external energy to the system via vertical vibration.
Keywords :
adhesives; capillarity; elemental semiconductors; integrated circuit bonding; integrated circuit modelling; lubrication; microassembling; self-assembly; silicon; surface energy; surface tension; vibrations; wafer level packaging; adhesive volume parameters; aqueous environment; capillary-based self-assembly; force balance analysis; heat curable adhesive; hydrophobic binding sites; mechanical bonding; microparts tilt angle; part-substrate lubrication; silicon parts; surface energy minimization; tilt correction methods; vertical vibration; water-adhesive interfacial tension; Assembly systems; Fabrication; Gold; Integrated circuit interconnections; Microelectronics; Minimization; Robotic assembly; Self-assembly; Semiconductor device modeling; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443842
Filename :
4443842
Link To Document :
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