DocumentCode :
2921481
Title :
Enabling efficient built-in-self-calibration for RFICs
Author :
Bou-Sleiman, Sleiman ; Ismail, Mohammed
Author_Institution :
Analog VLSI Lab., Ohio State Univ., Columbus, OH, USA
fYear :
2011
fDate :
11-14 Dec. 2011
Firstpage :
492
Lastpage :
495
Abstract :
Robustness and yield enhancement techniques for RF circuits and systems are gaining accelerating traction due to increased PVT variability in nanometer CMOS. One of the more viable approaches that make use of the increasingly heterogeneous systems is digitally-assisted RF, enabling circuit programmability and flexibility. With the inclusion of the more robust digital, RF circuits´ impairments may be successfully overcome or significantly diminished. This is enabled by implementing self-calibration mechanisms on top of self-test routines. In this paper, we highlight the basic requirements for enabling the on-chip self-calibration loop and discuss the main design steps. We also show an LNA circuit example demonstrating self-healing capabilities.
Keywords :
CMOS digital integrated circuits; calibration; integrated circuit yield; low noise amplifiers; radiofrequency integrated circuits; LNA circuit; PVT variability; RFIC; accelerating traction; built-in-self-calibration; circuit flexibility; circuit programmability; heterogeneous systems; nanometer CMOS; on-chip self-calibration loop; robust digital circuit; self-test routines; yield enhancement; CMOS integrated circuits; Calibration; Detectors; Impedance matching; Radio frequency; Tuning; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2011 18th IEEE International Conference on
Conference_Location :
Beirut
Print_ISBN :
978-1-4577-1845-8
Electronic_ISBN :
978-1-4577-1844-1
Type :
conf
DOI :
10.1109/ICECS.2011.6122320
Filename :
6122320
Link To Document :
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