• DocumentCode
    2921523
  • Title

    A fully dry self-assembly process with proper in-plane orientation

  • Author

    Park, Sangjun ; Böhringer, Karl F.

  • Author_Institution
    Washington Univ., Seattle
  • fYear
    2008
  • fDate
    13-17 Jan. 2008
  • Firstpage
    1077
  • Lastpage
    1080
  • Abstract
    A fully dry self-assembly method for chip-to-wafer stacking is developed in this paper. The assembly elements and substrate have complementary and interlocking features that place the assembly parts in the designated binding sites on the substrate. Proper in-plane orientation is achieved by deploying secondary features on the parts and substrate. These features are fabricated by a series of silicon deep RIE, sidewall passivation coating and isotropic etching. Experimental results show 100% assembly is accomplished on substrates with 2cm diameter, and 95% of assembly is done within 1 minute.
  • Keywords
    assembling; chip scale packaging; integrated circuit packaging; passivation; sputter etching; substrates; wafer level packaging; chip-to-wafer stacking; dry self-assembly process; interlocking feature; isotropic etching; proper in-plane orientation; sidewall passivation coating; silicon deep RIE; substrate; Assembly systems; Coatings; Etching; Fabrication; Passivation; Pins; Self-assembly; Silicon; Stacking; Wafer bonding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
  • Conference_Location
    Tucson, AZ
  • ISSN
    1084-6999
  • Print_ISBN
    978-1-4244-1792-6
  • Electronic_ISBN
    1084-6999
  • Type

    conf

  • DOI
    10.1109/MEMSYS.2008.4443846
  • Filename
    4443846