DocumentCode
2921523
Title
A fully dry self-assembly process with proper in-plane orientation
Author
Park, Sangjun ; Böhringer, Karl F.
Author_Institution
Washington Univ., Seattle
fYear
2008
fDate
13-17 Jan. 2008
Firstpage
1077
Lastpage
1080
Abstract
A fully dry self-assembly method for chip-to-wafer stacking is developed in this paper. The assembly elements and substrate have complementary and interlocking features that place the assembly parts in the designated binding sites on the substrate. Proper in-plane orientation is achieved by deploying secondary features on the parts and substrate. These features are fabricated by a series of silicon deep RIE, sidewall passivation coating and isotropic etching. Experimental results show 100% assembly is accomplished on substrates with 2cm diameter, and 95% of assembly is done within 1 minute.
Keywords
assembling; chip scale packaging; integrated circuit packaging; passivation; sputter etching; substrates; wafer level packaging; chip-to-wafer stacking; dry self-assembly process; interlocking feature; isotropic etching; proper in-plane orientation; sidewall passivation coating; silicon deep RIE; substrate; Assembly systems; Coatings; Etching; Fabrication; Passivation; Pins; Self-assembly; Silicon; Stacking; Wafer bonding;
fLanguage
English
Publisher
ieee
Conference_Titel
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location
Tucson, AZ
ISSN
1084-6999
Print_ISBN
978-1-4244-1792-6
Electronic_ISBN
1084-6999
Type
conf
DOI
10.1109/MEMSYS.2008.4443846
Filename
4443846
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