Study on a new sub-wavelength grating for antireflective structure of solar cell

Author

Hui-min Xia ; Kai-Hong Song ; Ru-ru Wang ; Lu-lu Peng

Author_Institution

Key Lab. of Intell. Comput. & Signal Process., Anhui Univ., Hefei, China

fYear

2012

fDate

22-26 Oct. 2012

Firstpage

778

Lastpage

781

Abstract

A new sub-wavelength grating for Anti-Reflective (AR) coating layer of solar cells is proposed in this paper. The reflectivity of this structure is investigated by the Rigorous Coupled Wave Analysis (RCWA) method. Numerical results show that compared with general SiO₂ AR coating layer, the average reflectivity of this new structure has greatly been reduced by 16% and 10.85% under TE and TM modes respectively. And the average reflection rate is less than 6% when the incident wave is working in a range of the wavelength between 400 nm and 1400nm. Good performance of the new structure makes it possible to develop practical applications.

Keywords

diffraction gratings; silicon compounds; solar cells; AR coating layer; RCWA method; SiO₂; TE mode; TM mode; antireflective structure; reflectivity; rigorous coupled wave analysis method; solar cell; subwavelength grating; wavelength 400 nm to 1400 nm; Coatings; Gratings; Numerical models; Photovoltaic cells; Reflection; Reflectivity; Silicon; AR coating layer; RCWA; Solar cell; Sub-wavelength grating;

fLanguage

English

Publisher

ieee

Conference_Titel

Antennas, Propagation & EM Theory (ISAPE), 2012 10th International Symposium on

Conference_Location

Xian

Print_ISBN

978-1-4673-1799-3

Type

conf

DOI

10.1109/ISAPE.2012.6408887

Filename

6408887