• DocumentCode
    2921720
  • Title

    A first analysis of a new fixed point iteration of the Boltzmann equation: Application to TCAD

  • Author

    Peikert, Vincent ; Schenk, Andreas

  • Author_Institution
    Swiss Fed. Inst. of Technol., Zurich, Switzerland
  • fYear
    2009
  • fDate
    12-17 July 2009
  • Firstpage
    148
  • Lastpage
    151
  • Abstract
    This paper presents a first analysis of a new general fixed point iteration of the Boltzmann transport equation. The scheme is based on a recent theory on Inverse Scattering Operators. Due to the fact that the implementation of this scheme is extremely involved, the expansion is truncated after the second iteration as a start. Comparisons with Monte Carlo simulations verify that the second iteration step gives sufficient corrections to the equilibrium distribution in bulk silicon, if the external field is not too large. However, it turns out that the second iteration is not sufficient to address inhomogeneous semiconductors. One reason is that a term containing the built-in electric field is not compensated in this order. Moreover, even in regions with low electric field and with small gradients of the quasi-Fermi level the second-order solution deviates notably from Monte Carlo simulations. Although this scheme has a lot of potential for TCAD applications, the adaptability is not straight-forward and further analysis of higher order terms is necessary.
  • Keywords
    Boltzmann equation; technology CAD (electronics); Boltzmann equation; Monte Carlo simulations; TCAD; fixed point iteration; Boltzmann equation; Computational modeling; Current density; Distribution functions; Inverse problems; Monte Carlo methods; Paper technology; Particle scattering; Semiconductor devices; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Research in Microelectronics and Electronics, 2009. PRIME 2009. Ph.D.
  • Conference_Location
    Cork
  • Print_ISBN
    978-1-4244-3733-7
  • Electronic_ISBN
    978-1-4244-3734-4
  • Type

    conf

  • DOI
    10.1109/RME.2009.5201351
  • Filename
    5201351