DocumentCode
2921803
Title
Lock-in thermography for the localization of prebreakdown leakage current on power diodes
Author
Riccio, M. ; Irace, A. ; Breglio, G.
Author_Institution
Dept. of Biomed. Electron. & Telecommun. Eng., Univ. of Naples Federico II, Naples, Italy
fYear
2009
fDate
12-17 July 2009
Firstpage
208
Lastpage
211
Abstract
In this paper we show how the Lock-In Thermography (LIT) technique is a valid choice to obtain information on the pre-breakdown leakage current distribution on power diodes. To do this we describe the LIT principle and our in house made experimental set-up. We finally show interesting experimental results on power Schottky diodes.
Keywords
Schottky diodes; avalanche breakdown; current distribution; infrared imaging; leakage currents; semiconductor device reliability; temperature measurement; current distribution; lock-in thermography; power Schottky diodes; prebreakdown leakage current localization; Biomedical electronics; Biomedical engineering; Frequency; Leakage current; Power engineering and energy; Power harmonic filters; Power measurement; Schottky diodes; Temperature sensors; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Research in Microelectronics and Electronics, 2009. PRIME 2009. Ph.D.
Conference_Location
Cork
Print_ISBN
978-1-4244-3733-7
Electronic_ISBN
978-1-4244-3734-4
Type
conf
DOI
10.1109/RME.2009.5201357
Filename
5201357
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