• DocumentCode
    2921817
  • Title

    Photocell enhanced technique for measuring starting electrode temperatures of fluorescent lamps

  • Author

    Hammer, E.E. ; Haas, Dan

  • Author_Institution
    GE Lighting, Cleveland, OH, USA
  • Volume
    3
  • fYear
    1997
  • fDate
    5-9 Oct 1997
  • Firstpage
    2313
  • Abstract
    This report discusses a photocell enhanced technique which evaluates the lamp-ballast compatibility relationship during the starting and operating scenario of fluorescent lamps. This technique, which fundamentally uses the dynamic RH/RC protocol, can certainly be used for preheat and rapid start type circuitry with either low frequency electromagnetic or high frequency electronic ballasts. It may also be used to evaluate instant start type circuits by analyzing the start time and sputtering characteristics of the starting signatures. The signatures of the F40T12 lamp using the conventional two-lamp rapid start ballast are discussed along with the signatures of other linear and CFL type fluorescent lamps using high frequency electronic ballasts. Examples of good and bad waveshapes are discussed with an explanation of why they are so interpreted
  • Keywords
    electrodes; fluorescent lamps; lamp accessories; photoelectric cells; starting; temperature measurement; F40T12 lamp; compact fluorescent lamps; dynamic RH/RC protocol; fluorescent lamps; high frequency electronic ballast; instant start type circuits; lamp-ballast compatibility relationship; linear fluorescent lamps; low frequency electromagnetic ballast; operating scenario; photocell enhanced technique; preheat; rapid start circuitry; sputtering characteristics; starting electrode temperatures measurement; starting signatures; two-lamp rapid start ballast; waveshapes; Circuits; Electrodes; Electronic ballasts; Fluorescent lamps; Frequency; Protocols; Sputtering; Temperature measurement; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industry Applications Conference, 1997. Thirty-Second IAS Annual Meeting, IAS '97., Conference Record of the 1997 IEEE
  • Conference_Location
    New Orleans, LA
  • ISSN
    0197-2618
  • Print_ISBN
    0-7803-4067-1
  • Type

    conf

  • DOI
    10.1109/IAS.1997.626386
  • Filename
    626386