DocumentCode :
2922200
Title :
Dynamic Characterization of Intensity Fluctuations in Semiconductor Lasers under Digital Modulation
Author :
Ahmed, Moustafa ; Yamada, Minoru
Author_Institution :
Minia University, Egypt; m.m.farghal@link.net
fYear :
2005
fDate :
30-02 Aug. 2005
Firstpage :
530
Lastpage :
531
Abstract :
We report on modeling of intensity fluctuations in semiconductor lasers subject to low and high speed digital modulation. We examine influence of deciding both decision and sampling times on bit-error-rate (BER). Correlation between BER and relative intensity noise (RIN) is presented.
Keywords :
Bit error rate; digital modulation; fluctuation; noise; semiconductor lasers; Bit error rate; Digital modulation; Digital systems; Fluctuations; Laser modes; Laser noise; Sampling methods; Semiconductor device noise; Semiconductor lasers; Signal analysis; Bit error rate; digital modulation; fluctuation; noise; semiconductor lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2005. CLEO/Pacific Rim 2005. Pacific Rim Conference on
Print_ISBN :
0-7803-9242-6
Type :
conf
DOI :
10.1109/CLEOPR.2005.1569496
Filename :
1569496
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2922200
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