DocumentCode :
292226
Title :
Vertical mode for an immersed structure composed of two elastic layers coupled by a thin water film
Author :
Rousseau, M. ; Coulouvrat, F. ; Lenoir, O. ; Khelil, H. ; Izbicki, J.L.
Volume :
2
fYear :
1994
fDate :
Oct. 31 1994-Nov. 3 1994
Firstpage :
757
Abstract :
We aim at evaluating the thickness of a thin water film, coupling two elastic layers. By a plane acoustic wave approach, we have shown the existence of a particular eigen-mode, called the vertical mode (V-mode), which strongly depends on the fluid layer. The water film thickness is expressed as a function of the V-mode cut-off frequency. The value of this particular frequency is experimentally obtained by a retrodiffusion and resonance spectra analysis. However, in practice, the acoustic waves propagate as a bounded beam, and it is necessary to show that the measurement accuracy remains compatible with a plane wave approach
Keywords :
eigenvalues and eigenfunctions; thickness measurement; ultrasonic materials testing; ultrasonic reflection; ultrasonic transmission; V-mode cutoff frequency; bounded beam; eigen-mode; elastic layers; immersed structure; measurement accuracy; multilayers; plane acoustic wave approach; resonance spectra analysis; retrodiffusion; stratified media; thin water film coupling; vertical mode; water film thickness evaluation; Acoustic beams; Acoustic reflection; Acoustic testing; Eigenvalues/eigenfunctions; Nondestructive testing; Thickness measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1994. Proceedings., 1994 IEEE
Conference_Location :
Cannes, France
Print_ISBN :
0-7803-2012-3
Type :
conf
DOI :
10.1109/ULTSYM.1994.401754
Filename :
401754
Link To Document :
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