Title :
RF noise modelling with PSP
Author :
Scholten, A.J. ; Smit, Gert-Jan ; Klaassen, D.B.M.
Author_Institution :
NXP-TSMC Res. Center, Eindhoven
Abstract :
In this presentation we will focus on the two main sources of noise in CMOS devices which are of interest for RF circuit, design: flicker noise and thermal noise.
Keywords :
CMOS integrated circuits; flicker noise; integrated circuit noise; semiconductor device models; semiconductor device noise; thermal noise; CMOS devices; PSP; RF circuit design; RF noise modelling; flicker noise; thermal noise; Radio frequency;
Conference_Titel :
Radio-Frequency Integration Technology, 2007. RFIT 007. IEEE International Workshop on
Conference_Location :
Rasa Sentosa Resort
Print_ISBN :
978-1-4244-1307-2
Electronic_ISBN :
978-1-4244-1308-9
DOI :
10.1109/RFIT.2007.4443950
