Reliability of oxide VCSELs in non-hermetic environments

Author

Xie, Suning ; De Brabander, Greg ; Widjaja, Wilson ; Koelle, Uli ; Cheng, An-Nien ; Giovane, Laura ; Hu, Frank ; Herrick, Robert ; Keever, Mark ; Osentowski, Tim

Author_Institution

Fiber Opt. Products Div., Agilent Technol., San Jose, CA, USA

Volume

2

fYear

2002

fDate

10-14 Nov. 2002

Firstpage

544

Abstract

We have identified three failure mechanisms in oxide VCSELs under bias in high humidity and developed environmentally robust oxide VCSELs. Following the discussion of the failure mechanisms, we report on our environmental reliability test results. We have identified three failure modes in the biased 85/85 testing. The most common moisture-related failure mode is dislocation growth in the active layers. The other two failure modes, semiconductor cracking and aperture surface degradation are accelerated by the bias current.

Keywords

cracks; dislocation climb; environmental degradation; environmental testing; failure analysis; humidity; semiconductor device reliability; semiconductor device testing; surface emitting lasers; active layers; aperture surface degradation; bias; bias current; biased 85/85 testing; dislocation climbing motion; dislocation growth; environmentally robust oxide VCSEL; failure mechanisms; high humidity; moisture-related failure mode; nonhermetic environments; oxide VCSEL; reliability; semiconductor cracking; Acceleration; Apertures; Degradation; Failure analysis; Humidity; Moisture; Optical fibers; Temperature; Testing; Vertical cavity surface emitting lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Society, 2002. LEOS 2002. The 15th Annual Meeting of the IEEE

ISSN

1092-8081

Print_ISBN

0-7803-7500-9

Type

conf

DOI

10.1109/LEOS.2002.1159422

Filename

1159422