Title :
Using FEA to develop a MIL-HDBK-2 17 SMT model
Author :
Bivens, Gretchen A. ; Pello, Edward F.
Author_Institution :
Rome Lab., Griffiss AFB, NY, USA
fDate :
March 31 1992-April 2 1992
Abstract :
A MIL-HDBK-217, Military Handbook for Reliability Prediction of Electronic Equipment, reliability prediction model was developed for surface mount technology (SMT) using thermal finite element analysis (FEA) simulations and environmental test data. FEAs for a number of conditions and packages were performed, the resulting strain values were translated to number of cycles to failure, and data regression distribution techniques were used to generate a failure rate model. This methodology, which is based on established analytical techniques and procedures, provides an alternative procedure for developing failure rate models when traditional approaches are not applicable.<>
Keywords :
finite element analysis; military equipment; packaging; printed circuits; reliability; surface mount technology; MIL-HDBK-217; Military Handbook; SMT model; data regression distribution techniques; environmental test data; established analytical techniques; failure rate model; military equipment; number of cycles to failure; procedure for developing failure rate models; reliability prediction model; strain values; surface mount technology; thermal finite element analysis; Analytical models; Capacitive sensors; Electronic equipment; Electronic equipment testing; Electronic packaging thermal management; Finite element methods; Military equipment; Packaging machines; Predictive models; Surface-mount technology;
Conference_Titel :
Reliability Physics Symposium 1992. 30th Annual Proceedings., International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-0473-X
DOI :
10.1109/RELPHY.1992.187640