Title :
Non-thermal saturation of P-I characteristics for InP- and GaSb-based broad-contact SCH-QW lasers
Author :
Maiorov, M. ; Menna, R. ; Martinelli, R. ; Khalfin, V. ; Harvey, M. ; Garbuzov, D. ; Connolly, J.
Author_Institution :
Sarnoff Corp., Princeton, NJ, USA
Abstract :
Summary form only given. High-power pulsed eye-safe IR laser diodes are currently of increasing interest for applications including range finders and IRCM systems. The output power for InP-based lasers is limited by power-current (P-I) characteristics saturation (rollover effect) rather than by the catastrophic optical damage of the mirror facets as observed for shorter wavelength devices. The current leakage from the quantum well active region has been considered as one of the main reasons of the rollover effect. We present data on the studies of P-I characteristics in the short pulsed regime for broad-contact InP-and GaSb-based separate-confinement heterostructure double-quantum-well (SCH-DQW) lasers emitting in the wavelength range 1.45-1.95 /spl mu/m.
Keywords :
III-V semiconductors; MOCVD; gallium compounds; indium compounds; laser beams; molecular beam epitaxial growth; optical fabrication; optical saturation; quantum well lasers; 1.45 to 1.95 mum; GaSb; GaSb-based broad-contact SCH-QW lasers; IRCM systems; InP; InP-based broad-contact SCH-QW lasers; InP-based lasers; P-I characteristics; applications; catastrophic optical damage; current leakage; high-power pulsed eye-safe IR laser diodes; mirror facets; nonthermal saturation; output power; power-current characteristics saturation; quantum well active region; range finders; rollover effect; separate-confinement heterostructure double-quantum-well lasers; short pulsed regime; shorter wavelength device; wavelength range; Copper; Gas lasers; Hip; Indium phosphide; Laser beam cutting; Optical devices; Optical pulses; Optical saturation; Power lasers; Temperature sensors;
Conference_Titel :
Lasers and Electro-Optics, 2000. (CLEO 2000). Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
1-55752-634-6
DOI :
10.1109/CLEO.2000.906961
