DocumentCode
2922557
Title
A new dispatching rule for optimizing machine utilization at a semiconductor test field
Author
Altendorfer, Klaus ; Kabelka, Bernhard ; Stöcher, Wolfgang
Author_Institution
Univ. of Appl. Sci., Steyr
fYear
2007
fDate
11-12 June 2007
Firstpage
188
Lastpage
193
Abstract
This paper presents a new dispatching rule for multi- product, multi-machine job shops with routing flexibility, targeting on maximizing throughput at a low level of WIP (work in process). It shows the relative advantage of the newly developed dispatching rule "work in parallel queue" (WIPQ) in comparison to other dispatching rules which attempt to increase the production system throughput. A simulation study is performed with a simulation model derived from a real world production system, which is a semiconductor test field. The results of this paper are logistic characteristic curves for each of the discussed dispatching rules in the evaluated production system. The results indicate a significant improvement of throughput as well as a more balanced workload within the studied production system by implementing the WIPQ rule.
Keywords
dispatching; job shop scheduling; semiconductor device manufacture; semiconductor device models; semiconductor device testing; dispatching rule; logistic characteristic curves; multiproduct multimachine job shops; production system; semiconductor test field; work in parallel queue; Costs; Dispatching; Job production systems; Job shop scheduling; Logistics; Performance evaluation; Production systems; Routing; Semiconductor device testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI
Conference_Location
Stresa
Print_ISBN
1-4244-0652-8
Electronic_ISBN
1-4244-0653-6
Type
conf
DOI
10.1109/ASMC.2007.375089
Filename
4259255
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