DocumentCode
2922620
Title
Empirical Studies on Multi-label Classification
Author
Li, Tao ; Zhang, Chengliang ; Zhu, Shenghuo
Author_Institution
Sch. of Comput. Sci., Florida Int. Univ., Miami, FL
fYear
2006
fDate
Nov. 2006
Firstpage
86
Lastpage
92
Abstract
In classic pattern recognition problems, classes are mutually exclusive by definition. However, in many applications, it is quite natural that some instances belong to multiple classes at the same time. In other words, these applications are multi-labeled, classes are overlapped by definition and each instance may be associated to multiple classes. In this paper, we present a comparative study on various multi-label approaches using both gene and scene data sets. We expect our research efforts provide useful insights on the relationships among various classifiers as well as various evaluation measures and shed lights on future research. Although there is no clear winner across various performance measures, SVM binary and multi-label ADTree perform better than the others on most counts. We then propose a meta-learning approach by combining SVM binary and ADTree. Our experiments demonstrate that the combined method can take the advantages of the single approaches
Keywords
pattern classification; support vector machines; tree data structures; ADTree classifier; SVM binary classifier; metalearning approach; multilabel classification; pattern recognition; Application software; Bayesian methods; Computer science; Laboratories; Layout; National electric code; Pattern recognition; Performance evaluation; Support vector machine classification; Support vector machines;
fLanguage
English
Publisher
ieee
Conference_Titel
Tools with Artificial Intelligence, 2006. ICTAI '06. 18th IEEE International Conference on
Conference_Location
Arlington, VA
ISSN
1082-3409
Print_ISBN
0-7695-2728-0
Type
conf
DOI
10.1109/ICTAI.2006.55
Filename
4031884
Link To Document