DocumentCode :
2922635
Title :
New Input Matching Technique for Cascode LNA in 90 nm CMOS for Millimeter Wave Applications
Author :
Hasani, Javad Yavand ; Kamarei, Mahmoud ; Ndagijimana, Fabien
Author_Institution :
Univ. of Tehran, Tehran
fYear :
2007
fDate :
9-11 Dec. 2007
Firstpage :
282
Lastpage :
285
Abstract :
Low noise amplifier optimization in modern CMOS technologies is based on the noise figure minimization, preserving the input power matching. Unfortunately available analysis and design methods incorporating this design method have used very simple transistor model and are not suitable for the design in millimeter wave frequencies. In this paper we present an accurate analysis to calculate the input impedance of the inductively source-degenerated cascode LNA. Based on the analysis results we have developed analytic equations to calculate the input matching components. To compare the proposed input matching with the available ones, we have designed identical 30GHz 5mW LNA circuits, using different input matching methods. The designs have been simulated using the foundry design kit for the STMicroelectornics 90 nm CMOS process. Based on the simulation results the proposed method outperforms the available methods. Finally the circuit designed using the proposed method, has been layed out and simulated in the foundry design kit.
Keywords :
CMOS integrated circuits; field effect MIMIC; low noise amplifiers; millimetre wave amplifiers; CMOS; LNA; cascode low noise amplifier optimization; circuit design; frequency 30 GHz; input impedance; input matching technique; millimeter wave applications; noise figure minimization; power 5 mW; size 90 nm; CMOS technology; Circuit simulation; Design methodology; Foundries; Impedance matching; Low-noise amplifiers; Millimeter wave technology; Millimeter wave transistors; Minimization; Noise figure; CMOS LNA; LNA; cascode; inductively degenerated; millimeter wave;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio-Frequency Integration Technology, 2007. RFIT 007. IEEE International Workshop on
Conference_Location :
Rasa Sentosa Resort
Print_ISBN :
978-1-4244-1307-2
Electronic_ISBN :
978-1-4244-1308-9
Type :
conf
DOI :
10.1109/RFIT.2007.4443971
Filename :
4443971
Link To Document :
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