• DocumentCode
    2922715
  • Title

    Yield Aware Equipment Preventive Maintenance (PM) Optimization

  • Author

    Inani, A. ; Kim, J. ; Liao, M. ; Shimazu, K. ; Lin, Y. ; Arthanari, S. ; Stine, B.

  • Author_Institution
    PDF Solutions, San Jose
  • fYear
    2007
  • fDate
    11-12 June 2007
  • Firstpage
    225
  • Lastpage
    227
  • Abstract
    Typically equipment PM optimization and strategy is determined using a mix of various sources and inline inspection. In this work, the need for a more yield aware optimization strategy is recognized and recommendations made to implement this.
  • Keywords
    inspection; preventive maintenance; inline inspection; preventive maintenance optimization; yield aware equipment preventive maintenance; yield aware optimization; Drilling; Inspection; Optimization methods; Performance evaluation; Performance gain; Preventive maintenance; Production; Productivity; Testing; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Semiconductor Manufacturing Conference, 2007. ASMC 2007. IEEE/SEMI
  • Conference_Location
    Stresa
  • Print_ISBN
    1-4244-0652-8
  • Electronic_ISBN
    1-4244-0653-6
  • Type

    conf

  • DOI
    10.1109/ASMC.2007.375098
  • Filename
    4259264