DocumentCode :
2922780
Title :
Binary mutation testing through dynamic translation
Author :
Becker, Markus ; Kuznik, Christoph ; Joy, Mabel Mary ; Xie, Tao ; Mueller, Wolfgang
Author_Institution :
Fac. of Electr. Eng., Comput. Sci. & Math., Univ. of Paderborn, Paderborn, Germany
fYear :
2012
fDate :
25-28 June 2012
Firstpage :
1
Lastpage :
12
Abstract :
This paper presents a novel mutation based testing method through binary mutation. For this, a table of mutants is derived by control flow analysis of a disassembled binary under test. Mutations are injected at runtime by dynamic translation. Thus, our approach neither relies on source code nor a certain compiler. As instrumentation is avoided, testing results correspond to the original binary. In addition to high-level language faults, the proposed approach captures target specific faults related to compiling and linking. We investigated the software of an automotive case study. For this, a taxonomy of mutation operators for the ARM instruction set is proposed. Our experimental results prove 100% accuracy w.r.t. confidence metrics provided by conventional testing methods while avoiding significant mutant compilation overhead. Further speed up is achieved by an efficient binary mutation testing framework that relies on extending the open source software emulator QEMU.
Keywords :
instruction sets; program compilers; program diagnostics; program interpreters; program testing; program verification; software fault tolerance; ARM instruction set; QEMU; binary mutation testing; compiler; confidence metrics; control flow analysis; dynamic translation; fault-based testing; high-level language faults; mutation operators; open source software emulator; software verification; source code; Binary codes; Computer architecture; Joining processes; Measurement; Registers; Software; Testing; Embedded software verification; fault-based testing; mutation analysis; software emulation; test confidence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Dependable Systems and Networks (DSN), 2012 42nd Annual IEEE/IFIP International Conference on
Conference_Location :
Boston, MA
ISSN :
1530-0889
Print_ISBN :
978-1-4673-1624-8
Electronic_ISBN :
1530-0889
Type :
conf
DOI :
10.1109/DSN.2012.6263914
Filename :
6263914
Link To Document :
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