• DocumentCode
    2922940
  • Title

    Acoustic evaluation of electronic plastic packages

  • Author

    Siettmann, James ; Dias, Rajen ; Fiebelkorn, Ken

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    1992
  • fDate
    March 31 1992-April 2 1992
  • Firstpage
    309
  • Lastpage
    314
  • Abstract
    Describe a technique of C-mode scanning acoustic microscope (CSAM) image acquisition. The role acoustic reflected wave analysis plays in the acquisition of CSAM images is considered. The effect that mold compound thickness and transducer choice have on the resolution of leadframe features in plastic packages is illustrated. Potential applications of acoustic reflected wave analysis are presented.<>
  • Keywords
    acoustic microscopy; acoustic transducers; packaging; C-mode scanning acoustic microscope; CSAM images; acoustic reflected wave analysis; electronic plastic packages; image acquisition; leadframe features; mold compound thickness; transducer choice; Acoustic materials; Acoustic pulses; Acoustic reflection; Acoustic transducers; Acoustic waves; Delamination; Electronics packaging; Focusing; Microscopy; Plastic packaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium 1992. 30th Annual Proceedings., International
  • Conference_Location
    San Diego, CA, USA
  • Print_ISBN
    0-7803-0473-X
  • Type

    conf

  • DOI
    10.1109/RELPHY.1992.187662
  • Filename
    187662