Title :
The Influence Of Complex Geometries and Stress Non-Uniformity On Reliability
Author_Institution :
Front End Manufacturing, GOI Reliability, ELMOS Semiconductor AG, Heinrich-Hertz Str. 1, D-44227 Dortmund, Germany. andreas.aal@elmos.eu
Keywords :
Cleaning; Composite materials; Dielectric devices; Geometry; Materials reliability; Materials testing; Reliability theory; Semiconductor device reliability; Stress; System testing;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796125
