DocumentCode

2923058

Title

Ageing under illumination of MOS transistors for active pixel sensors (APS) applications

Author

Lopez, Diana ; Monsieur, Frédéric ; Balestra, Francis

fYear

2008

fDate

12-16 Oct. 2008

Firstpage

1

Lastpage

19

Keywords

Aging; CMOS image sensors; Degradation; FETs; Lighting; MOSFETs; Photodiodes; Pixel; Stress; Transistors;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International

Conference_Location

South lake Tahoe, CA, USA

ISSN

1930-8841

Print_ISBN

978-1-4244-2194-7

Electronic_ISBN

1930-8841

Type

conf

DOI

10.1109/IRWS.2008.4796127

Filename

4796127