Title :
Ageing under illumination of MOS transistors for active pixel sensors (APS) applications
Author :
Lopez, Diana ; Monsieur, Frédéric ; Balestra, Francis
Keywords :
Aging; CMOS image sensors; Degradation; FETs; Lighting; MOSFETs; Photodiodes; Pixel; Stress; Transistors;
Conference_Titel :
Integrated Reliability Workshop Final Report, 2008. IRW 2008. IEEE International
Conference_Location :
South lake Tahoe, CA, USA
Print_ISBN :
978-1-4244-2194-7
Electronic_ISBN :
1930-8841
DOI :
10.1109/IRWS.2008.4796127
